This inventor holds 1 USPTO granted patent. Top assignee: Washington Research Foundation. Active years: 1989.
Company Filing History:
Years Active: 1989
Title: George F Mauer: Innovator in Capacitive Sensing Technology
Introduction
George F Mauer is a notable inventor based in Seattle, WA (US). He has made significant contributions to the field of capacitive sensing technology. His innovative work has led to the development of a unique sensor that measures the profile of surfaces with precision.
Latest Patents
Mauer holds a patent for a "Fringe field capacitive sensor for measuring profile of a surface." This invention involves a capacitive distance sensor designed to measure the distance between a probe and the surface of a conductive body. The sensor features a conductive plate element mounted by the probe, which is significantly thinner than its height and width. Positioned adjacent to and normal to the body surface, the sensor measures the fringe field capacitance between the plate element and the body to determine the distance accurately. The probe can be scanned across the body surface to provide detailed surface profile measurements. Additionally, a probe with multiple plate elements can be used to measure the geometry of openings, such as holes, by maintaining proximity to the hole wall. This technology allows for both profile and geometry measurements, enhancing the understanding of surface topography.
Career Highlights
George F Mauer has been associated with the Washington Research Foundation, where he has furthered his research and development efforts. His work has been instrumental in advancing capacitive sensing technologies, which have applications in various industries.
Collaborations
Mauer has collaborated with notable colleagues, including Joseph L Garbini and Laurence J Albrecht. These partnerships have contributed to the success and innovation of his projects.
Conclusion
George F Mauer's contributions to capacitive sensing technology exemplify the impact of innovative thinking in engineering. His patent and work at the Washington Research Foundation highlight his commitment to advancing measurement technologies.
