This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2000.
Company Filing History:
Years Active: 2000
Title: George Dean Ogden: Innovator in X-ray Moire Interferometry
Introduction
George Dean Ogden is a notable inventor based in Binghamton, NY (US). He has made significant contributions to the field of electronic devices through his innovative work. His expertise lies in testing laminates using advanced techniques that enhance the reliability of multilayer electronic devices.
Latest Patents
Ogden holds a patent for "Testing laminates with x-ray moire interferometry." This patent focuses on the registration of layers in multilayer electronic devices, which is tested and measured by X-ray moire interferometry. His work in this area has the potential to improve the manufacturing and quality assurance processes in electronics.
Career Highlights
George Dean Ogden is associated with the International Business Machines Corporation, commonly known as IBM. His role at IBM has allowed him to work on cutting-edge technologies and contribute to the advancement of electronic device testing methodologies.
Collaborations
Throughout his career, Ogden has collaborated with talented individuals such as Natalie Barbara Feilchenfeld and Douglas H Strope. These collaborations have fostered innovation and have been instrumental in the development of new technologies.
Conclusion
George Dean Ogden's contributions to the field of electronic devices through his patent and work at IBM highlight his role as an innovator. His advancements in testing methodologies are paving the way for improved electronic device reliability.