Fremont, CA, United States of America

George Alajajian

This inventor holds 1 USPTO granted patent. Top assignee: Applied Materials, Inc.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: George Alajajian. Retrieved from https://idiyas.com/inventor/george-alajajian

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: George Alajajian: Innovator in Semiconductor Processing

Introduction

George Alajajian is a notable inventor based in Fremont, CA (US). He has made significant contributions to the field of semiconductor processing, particularly through his innovative patent that addresses the measurement of reactive species in this domain.

Latest Patents

Alajajian holds a patent for an apparatus designed to measure concentrations of radicals in semiconductor processing. This apparatus includes a reactive species source, a spectral measurement volume, a light source that emits a light beam into the spectral measurement volume, and a spectrometer that receives the light beam. The controller in the apparatus is configured to manage the light source and spectrometer to determine both environment and baseline spectra, allowing for the calculation of a net spectrum and estimation of the concentration of reactive species.

Career Highlights

George Alajajian is currently employed at Applied Materials, Inc., a leading company in the semiconductor industry. His work focuses on advancing technologies that enhance the efficiency and accuracy of semiconductor processing.

Collaborations

Some of Alajajian's coworkers include Ramesh Gopalan and Tom K Cho, who contribute to the innovative environment at Applied Materials, Inc.

Conclusion

George Alajajian's work in semiconductor processing exemplifies the impact of innovation in technology. His patent reflects a commitment to improving measurement techniques in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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