Seoul, South Korea

Geonhee Kim

This inventor holds 1 USPTO granted patent. Top assignee: Seoul National University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Geonhee Kim. Retrieved from https://idiyas.com/inventor/geonhee-kim-glmpxfji

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Geonhee Kim and Silver Nanowire Patterning

Introduction

Geonhee Kim is an inventor based in Seoul, South Korea, associated with Seoul National University. His patent work focuses on patterning silver nanowire thin films, a technology relevant to conductive materials and thin-film fabrication.

Latest Patents

Kim is listed as an inventor on 1 patent: “Silver Nanowire Thin-Film Patterning Method.” The disclosed method patterns an adhesive conductive polymer thin film on a substrate, prepares a polydimethylsiloxane (PDMS) stamp coated with a silver nanowire thin film, and bonds the patterned substrate to the stamp. The two are then separated, transferring the silver nanowire pattern through the process.

Career Highlights

Kim’s listed invention addresses a method for forming patterned silver nanowire films using a conductive polymer layer and a PDMS stamp. His association with Seoul National University connects this work to an academic research environment.

Collaborations

The patent lists Yongtaek Hong and Jongjang Park as fellow inventors, indicating their collaboration with Kim on the silver nanowire patterning method.

Conclusion

Geonhee Kim’s patent contribution centers on a transfer-based approach to patterning silver nanowire thin films, developed in collaboration with fellow inventors and associated with Seoul National University.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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