High Wycombe, United Kingdom

Geoffrey Youd

This inventor holds 1 USPTO granted patent. Top assignee: The Wiggins Teape Group Limited. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Geoffrey Youd. Retrieved from https://idiyas.com/inventor/geoffrey-youd

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Geoffrey Youd

Introduction

Geoffrey Youd is a notable inventor based in High Wycombe, GB. He has made significant contributions to the field of paper and board testing through his innovative patent. His work focuses on improving the quality and usability of paper products.

Latest Patents

Geoffrey Youd holds a patent for a "Method and apparatus for determining the propensity of a paper or board." This patent discloses a method of testing the propensity of a paper or board to dust. The method involves pressing a reference surface to the surface to be tested at a predetermined pressure. The dust adhering to the reference surface is then measured to obtain an indicative reading.

Career Highlights

Geoffrey Youd is associated with The Wiggins Teape Group Limited, where he applies his expertise in paper technology. His work has contributed to advancements in the industry, particularly in quality control and product testing.

Collaborations

Geoffrey has collaborated with Roger A Allen, enhancing the research and development efforts within their organization. Their partnership has fostered innovation and improved methodologies in paper testing.

Conclusion

Geoffrey Youd's contributions to the field of paper and board testing through his patent demonstrate his commitment to innovation. His work continues to influence the industry and improve product quality.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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