Cropston, United Kingdom

Geoffrey L Heathcote

This inventor holds 1 USPTO granted patent. Top assignee: The Rank Organisation Plc. Active years: 1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Geoffrey L Heathcote. Retrieved from https://idiyas.com/inventor/geoffrey-l-heathcote

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 1985

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1 patent (USPTO):Explore Patents

Title: The Innovations of Geoffrey L Heathcote

Introduction

Geoffrey L Heathcote is a notable inventor based in Cropston, GB. He has made significant contributions to the field of measuring apparatus through his innovative designs. His work primarily focuses on enhancing the accuracy and efficiency of measurement tools.

Latest Patents

Heathcote holds a patent for "Probes for measuring apparatus." This invention features a contact-sensitive probe designed for coordinate measuring apparatus. The probe includes a housing with seatings that define a stable rest position for a stylus member. The stylus projects from the housing and terminates at a sensing tip. A spring mechanism urges the stylus member toward the stable rest position, allowing for its relocation after contact with a test surface. The displacement of the stylus is detected by a capacitative transducer, which produces an output signal indicative of a change in capacitance.

Career Highlights

Geoffrey L Heathcote is associated with The Rank Organisation Plc, where he applies his expertise in measurement technologies. His innovative approach has led to advancements in the precision of measuring instruments.

Collaborations

Heathcote has worked alongside his coworker, Alan C Hollowell, contributing to the development of new technologies in their field.

Conclusion

Geoffrey L Heathcote's contributions to measuring apparatus demonstrate his commitment to innovation and precision in technology. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to improving measurement tools.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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