Geoff O'Donoghue

Title: Innovations by Geoff O'Donoghue: Pioneering Patents in Integrated Circuit Testing

Introduction

Geoff O'Donoghue is an accomplished inventor based in Andover, MA, with a solid record of innovation in the field of integrated circuit testing. With two patents to his name, his work significantly contributes to the advancement of technology in electronic components.

Latest Patents

Geoff O'Donoghue's latest patents showcase his expertise in detecting defects within integrated circuit processing. The first patent is for an "Apparatus and method for detecting defects arising as a result of - A probe card tester for detecting defects occurring as a result of integrated circuit processing of a substrate having a plurality of spaced conductors." This invention includes a probe card tester that utilizes a set of parallel resistors to connect at least one in parallel with each conductor, along with a series of resistors forming a series resistance. Additionally, it features probe elements for detecting defects bridging the conductors.

The second patent is titled "Integrated circuit interlevel conductor defect characterization test." This integrated circuit test structure involves first and second spaced test pads, a conductor layer, and an insulator layer between the conductor layer and the test pads. It comprises interlevel conductors with variable cross-sectional conductive areas to effectively detect defects that may limit the current-carrying capacity of the first interlevel conductor while not affecting the second interlevel conductor.

Career Highlights

Geoff is currently employed at Analog Devices, Inc., where he continues to innovate within the electronics industry. His work and patents demonstrate a deep understanding of the complexities involved in integrated circuit design and testing.

Collaborations

Throughout his career, Geoff has collaborated with notable colleagues, including Scott C. Munroe. These collaborations have enriched his research and development endeavors, leading to groundbreaking advancements in technology.

Conclusion

Geoff O'Donoghue's contributions to the field of integrated circuit testing through his patents highlight his role as an influential inventor. His work not only enhances the reliability of electronic devices but also sets a benchmark for future innovations in the industry.