The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 1997
Filed:
Nov. 20, 1995
Geoff O'Donoghue, Andover, MA (US);
Scott C Munroe, Carlisle, MA (US);
Analog Devices, Inc., Norwood, MA (US);
Abstract
An interlevel conductor defect characterization integrated circuit test structure including first and second spaced test pads, a conductor layer, an insulator layer between the conductor layer and the test pads; and a first interlevel conductor having a unit cross-sectional conductive area extending between the first test pad and the conductor layer, and a second interlevel conductor extending between said second test pad and said conductor layer and having a cross-sectional conductive area substantially greater than the unit area for detecting defects which restrict the current carrying capacity of said unit area of the first interlevel conductor but not the second interlevel conductor.