Tokyo, Japan

Gensaku Nagai

This inventor holds 1 USPTO granted patent. Top assignee: Formfactor, Inc.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gensaku Nagai. Retrieved from https://idiyas.com/inventor/gensaku-nagai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Gensaku Nagai - Innovator in Probe Card Technology

Introduction

Gensaku Nagai is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of electronic device testing through his innovative designs. His work primarily focuses on probe card assemblies, which are essential for ensuring the functionality of electronic devices.

Latest Patents

Gensaku Nagai holds a patent for a "Probe card assembly for testing electronic devices." This invention features a guide plate that includes probe guides for holding probes in predetermined positions. The assembly also comprises a wiring structure attached to the guide plate, allowing connection tips of the probes to be positioned against and attached to contacts on the wiring structure. This design enables the wiring structure to expand or contract at a greater rate than the guide plate. Additionally, the probes incorporate compliant elements that fail upon exposure to high electrical current and thermal stresses, strategically located away from the contact tips.

Career Highlights

Gensaku Nagai is currently employed at FormFactor, Inc., where he continues to develop advanced testing solutions for electronic devices. His expertise in probe card technology has positioned him as a key player in the industry.

Collaborations

Throughout his career, Gensaku has collaborated with talented individuals such as Mukesh K Selvaraj and Edward J Milovic. These partnerships have contributed to the advancement of technology in the field of electronic testing.

Conclusion

Gensaku Nagai's innovative work in probe card assemblies has made a significant impact on the testing of electronic devices. His contributions continue to shape the industry and enhance the reliability of electronic products.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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