Novosibirsk, Russia

Genrikh K Lev

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Genrikh K Lev. Retrieved from https://idiyas.com/inventor/genrikh-k-lev

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:

goldMedal1 out of 834,513 
Other
 patents

Years Active: 1990

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Genrikh K Lev: Innovator in Bulk Material Metering

Introduction

Genrikh K Lev is a notable inventor based in Novosibirsk, Russia. He has made significant contributions to the field of engineering, particularly in the area of bulk material metering. His innovative approach has led to the development of a patented apparatus that enhances the efficiency of measuring bulk materials.

Latest Patents

Genrikh K Lev holds a patent for an "Apparatus for Metering Bulk Materials." This invention showcases his expertise and commitment to improving industrial processes. The patent reflects his ability to address practical challenges in material handling and measurement.

Career Highlights

Throughout his career, Lev has demonstrated a strong dedication to innovation. His work has not only contributed to his field but has also paved the way for advancements in related technologies. His patent is a testament to his skills and knowledge in engineering.

Collaborations

Genrikh K Lev has collaborated with talented individuals such as Evgeny I Shemyakin and Stanislav B Stazhevsky. These partnerships have likely enriched his work and contributed to the success of his inventions.

Conclusion

Genrikh K Lev is a distinguished inventor whose work in bulk material metering has made a significant impact. His patent and collaborations highlight his innovative spirit and dedication to advancing technology in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…