Mareno di Piave, Italy

Gennaro Giovanni Nigro

This inventor holds 1 USPTO granted patent and 2 published patent applications and 2 EPO patents. Top assignee: Silca S.p.a.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gennaro Giovanni Nigro. Retrieved from https://idiyas.com/inventor/gennaro-giovanni-nigro

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Gennaro Giovanni Nigro: Innovator in Key-Duplicating Technology

Introduction

Gennaro Giovanni Nigro is a notable inventor based in Mareno di Piave (TV), Italy. He has made significant contributions to the field of key-duplicating technology. His innovative approach has led to the development of a unique method for detecting wear in milling cutters used in key-duplicating machines.

Latest Patents

Gennaro holds a patent for a method that detects the wear of a milling cutter in a key-duplicating machine. This method involves measuring the current and voltage absorbed by the motor during cutting cycles. By analyzing these values, it is possible to determine the wear on the cutting portions of the cutter, ensuring optimal performance and precision in key duplication.

Career Highlights

Gennaro Giovanni Nigro is associated with Silca S.p.a., a company renowned for its expertise in key duplication and security solutions. His work at Silca has allowed him to apply his innovative ideas in a practical setting, contributing to advancements in the industry.

Collaborations

Gennaro collaborates with Maurizio Ugel, a fellow professional in the field. Their partnership enhances the development of innovative solutions in key-duplicating technology.

Conclusion

Gennaro Giovanni Nigro's contributions to key-duplicating technology exemplify the impact of innovation in practical applications. His patent for detecting cutter wear is a testament to his expertise and dedication to improving industry standards.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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