Oaklandon, IN, United States of America

Gene R Carey

This inventor holds 1 USPTO granted patent. Top assignee: Diversified Systems, Inc.. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gene R Carey. Retrieved from https://idiyas.com/inventor/gene-r-carey

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Gene R. Carey: Innovator in Manufacturing Technology

Introduction

Gene R. Carey is a notable inventor based in Oaklandon, Indiana. He has made significant contributions to the field of manufacturing technology. His innovative approach has led to the development of a unique patent that enhances manufacturing processes.

Latest Patents

Gene R. Carey holds a patent for a manufacturing method and apparatus. This method involves several steps, including providing a batch of articles with a machine-detectable tag. The process includes using a detector to identify the tag and signaling the controller to prioritize processing for the batch. This invention streamlines manufacturing operations and improves efficiency.

Career Highlights

Gene R. Carey is associated with Diversified Systems, Inc., where he applies his expertise in manufacturing technology. His work has been instrumental in advancing the company's capabilities in this sector. With a focus on innovation, he continues to contribute to the field.

Collaborations

Gene has collaborated with notable coworkers, including Stanley L. Bentley and Patrick A. Heinzman. Their combined efforts have fostered a creative environment that encourages technological advancements.

Conclusion

Gene R. Carey is a distinguished inventor whose work in manufacturing technology has made a lasting impact. His patent reflects his commitment to innovation and efficiency in manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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