Hyogo, Japan

Gen Tokumoto

This inventor holds 1 USPTO granted patent. Top assignee: Keysight Technologies, Inc.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gen Tokumoto. Retrieved from https://idiyas.com/inventor/gen-tokumoto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Gen Tokumoto: Innovator in Measurement Systems

Introduction

Gen Tokumoto, an accomplished inventor based in Hyogo, Japan, has made significant strides in the field of measurement systems. With one patent to his name, he has developed innovative solutions that address the challenges associated with measurement instability, showcasing his expertise and commitment to advancing technology.

Latest Patents

Gen Tokumoto's notable patent focuses on removing the effects of instabilities in measurement systems. This invention provides a measurement system and method that enhance the accuracy of measuring S-parameters of a device under test (DUT). The method includes determining the characteristic of the measurement system, identifying instability locations in the time domain, and compensating for changes to ensure precise measurements.

Career Highlights

Currently, Tokumoto is employed at Keysight Technologies, Inc., where he leverages his knowledge and skills to contribute to cutting-edge advancements in measurement technologies. His work reflects a deep understanding of complex systems and a dedication to improving measurement reliability.

Collaborations

Throughout his career, Gen Tokumoto has collaborated with esteemed colleagues such as Joel P. Dunsmore and Yasuaki Komatsu. These professional relationships underscore the importance of teamwork in fostering innovation and achieving remarkable results in the field of engineering.

Conclusion

Gen Tokumoto stands out as an inventor whose contributions to measurement systems demonstrate his ability to innovate and solve practical challenges in technology. His work exemplifies how targeted inventions can lead to enhanced precision and reliability, paving the way for future advancements in measurement methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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