Garner, NC, United States of America

Gavin David Ripley

This inventor holds 1 USPTO granted patent. Top assignee: Caterpillar Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gavin David Ripley. Retrieved from https://idiyas.com/inventor/gavin-david-ripley

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Gavin David Ripley: Inventor of Implement Metering Control

Introduction

Gavin David Ripley is an inventor associated with Garner, North Carolina, and Caterpillar Inc. His patent work concerns machine control systems that adjust an implement’s movement during a metering operation.

Latest Patents

Ripley is credited with 1 patent, titled “Implement Metering Control.” The patent describes a controller that receives a command to begin a metering operation, which vibrates a machine implement by repeatedly changing its angle or position. While the operation is underway, the controller adjusts a baseline metering signal using sensor data about an implement characteristic. It then uses the resulting control signal to actuate the implement.

Career Highlights

Ripley’s listed invention addresses the coordination of sensor data, control signals, and implement actuation in machinery. This approach enables the controller to adapt metering behavior to information about the implement during operation. The available information associates his work with Caterpillar Inc.

Collaborations

James Joseph Williams is identified as Ripley’s coworker. The provided information does not specify whether Williams collaborated with him on the “Implement Metering Control” patent.

Conclusion

Gavin David Ripley’s patent work focuses on sensor-informed control of machine implements, reflecting an engineering approach to adaptive metering operations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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