Newark, DE, United States of America

Gaurav Pandey

This inventor holds 1 USPTO granted patent. Top assignees: The Boeing Company, University of Delaware. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gaurav Pandey. Retrieved from https://idiyas.com/inventor/gaurav-pandey-ls2m79bp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Gaurav Pandey: Innovator in Structural Monitoring

Introduction

Gaurav Pandey is an accomplished inventor based in Newark, Delaware. He has made significant contributions to the field of structural monitoring through his innovative patent. His work reflects a commitment to advancing technology and improving safety in various applications.

Latest Patents

Gaurav holds a patent for a "System and methods for use in monitoring a structure." This system includes a strip of piezoresistive material embedded with nano-elements, electrodes coupled to the strip, and a resistance detector designed to measure the strip's resistance. This invention showcases his expertise in developing advanced monitoring solutions.

Career Highlights

Throughout his career, Gaurav has worked with notable organizations, including The Boeing Company and the University of Delaware. His experiences in these institutions have allowed him to refine his skills and contribute to significant projects in engineering and technology.

Collaborations

Gaurav has collaborated with professionals such as Michael Joseph DeLuca and Christopher J. Felker. These partnerships have enriched his work and fostered innovation in his projects.

Conclusion

Gaurav Pandey is a notable inventor whose work in structural monitoring exemplifies the intersection of technology and safety. His contributions continue to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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