Company Filing History:
Years Active: 2004-2024
Title: Gary Wayne Scheiffele: Innovator in X-ray Scattering Mitigation
Introduction
Gary Wayne Scheiffele is a notable inventor based in Gainesville, FL (US). He has made significant contributions to the field of x-ray technology, particularly in minimizing scattering artifacts. With a total of 5 patents to his name, Scheiffele's work is recognized for its innovative approaches and practical applications.
Latest Patents
One of Scheiffele's latest patents focuses on methods and compositions for minimizing x-ray scattering artifacts. This patent discloses various methods for contacting an object with an x-ray scattering mitigation material. The methods include coating the material on the object, spraying a solution of suspension, or dry powder coating. Additionally, the object can be immersed in a fluid that contains the x-ray scattering material, which can be a gas, liquid, or gel. The disclosed material is optimized for mitigating both Compton and Rayleigh radiation scattering, showcasing the versatility and effectiveness of his innovations.
Career Highlights
Scheiffele is affiliated with the University of Florida Research Foundation, Incorporated, where he continues to advance his research and development efforts. His work has not only contributed to academic knowledge but also has practical implications in medical imaging and other fields that utilize x-ray technology.
Collaborations
Some of his notable coworkers include Edward L Stanley and Spyros A Svoronos. Their collaborative efforts have further enhanced the research output and innovation potential within their projects.
Conclusion
Gary Wayne Scheiffele stands out as a significant figure in the realm of x-ray technology innovation. His patents and research efforts continue to influence the field positively.