Tucson, AZ, United States of America

Gary M Salvail



Average Co-Inventor Count = 2.3

ph-index = 6

Forward Citations = 118(Granted Patents)


Location History:

  • Tucson, AZ (US) (1997 - 2003)
  • Camarillo, CA (US) (1993 - 2023)

Company Filing History:


Years Active: 1993-2023

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12 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Gary M. Salvail

Introduction

Gary M. Salvail is a notable inventor based in Tucson, Arizona, recognized for his significant contributions to the field of radio frequency technology. With a total of 12 patents to his name, he has made remarkable advancements that enhance the capabilities of RF testing equipment.

Latest Patents

One of his latest inventions is the RF test hat, designed to facilitate the measurement of electromagnetic radiation. This innovative device comprises a cylinder with forward and aft ends, an end cap, an arm and strap assembly, and various absorber materials. The receiving antenna, located within the first absorber material, measures the intensity of electromagnetic beams. Additionally, the lens within the cylinder spreads the beam across a larger surface area, optimizing the device's functionality. Another version of the RF test hat features a body with a substantially rectangular portion, open ends, and upper and lower mesh screens that enhance its design and performance.

Career Highlights

Throughout his career, Gary has worked with prominent organizations, including Raytheon Company and the United States Navy. His experience in these esteemed institutions has allowed him to develop and refine his innovative ideas, contributing to advancements in military and commercial applications of RF technology.

Collaborations

Gary has collaborated with talented individuals such as Christian Hugo and I-Ping Yu, further enriching his work through shared expertise and insights.

Conclusion

Gary M. Salvail's contributions to the field of radio frequency technology exemplify the spirit of innovation. His inventions, particularly the RF test hat, showcase his commitment to enhancing measurement techniques in this critical area. His work continues to influence the industry and inspire future advancements.

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