Madison, AL, United States of America

Gary L Workman

This inventor holds 1 USPTO granted patent. Top assignees: C.f.c. Technology, Inc., University of Alabama in Huntsville. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gary L Workman. Retrieved from https://idiyas.com/inventor/gary-l-workman-90pdxrz8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Gary L Workman: Innovator in Fluid Analysis

Introduction

Gary L Workman is an accomplished inventor based in Madison, AL (US). He has made significant contributions to the field of fluid analysis, particularly through his innovative patent. His work has implications for various industries that rely on precise fluid measurements.

Latest Patents

Gary L Workman holds a patent for an "Apparatus and method for fluid analysis." This invention includes a sensor designed to determine the index of refraction of a fluid. Advanced methods of fluid analysis relate the index of refraction to other measured physical characteristics of the fluid. This patent showcases his expertise and commitment to enhancing fluid analysis techniques.

Career Highlights

Throughout his career, Gary has worked with notable organizations, including C.F.C. Technology, Inc. and the University of Alabama in Huntsville. His experience in these institutions has allowed him to develop and refine his innovative ideas in fluid analysis.

Collaborations

Gary has collaborated with esteemed colleagues such as Harold J See and Kenneth D Turner. These partnerships have contributed to his success and the advancement of his research in fluid analysis.

Conclusion

In summary, Gary L Workman is a notable inventor whose work in fluid analysis has led to significant advancements in the field. His patent and collaborations reflect his dedication to innovation and excellence.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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