Idaho Falls, ID, United States of America

Gary D Seifert


Average Co-Inventor Count = 2.5

ph-index = 4

Forward Citations = 80(Granted Patents)


Company Filing History:


Years Active: 1997-2003

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4 patents (USPTO):Explore Patents

Title: Gary D. Seifert: Innovator in Electro-Optic Technology

Introduction

Gary D. Seifert is a notable inventor based in Idaho Falls, ID, with a focus on electro-optic technology. He holds a total of 4 patents, showcasing his contributions to the field of high voltage measurement. His innovative designs have paved the way for advancements in non-contact voltage sensing.

Latest Patents

One of Gary's latest patents is the Electro-optic high voltage sensor. This small-sized sensor is capable of accurately measuring high voltages without direct contact with a conductor or voltage source. When placed in an electric field, the sensor receives an input beam of electromagnetic radiation. A polarization beam displacer separates this input beam into two beams with orthogonal linear polarizations. The design allows for precise measurement by utilizing the Pockels effect, which elliptically polarizes the beam as it travels through a crystal. The system may also include a detector and a signal processor to convert the output beams into electrical signals and determine the voltage based on the analysis of these beams.

Career Highlights

Throughout his career, Gary has worked with several prominent companies, including Bechtel, BWXT Idaho, LLC, and Lockheed Idaho Technologies Company. His experience in these organizations has contributed significantly to his expertise in electro-optic technologies and high voltage measurement systems.

Collaborations

Gary has collaborated with notable coworkers such as James R. Davidson and Anthony C. Zuppero, further enhancing his innovative work in the field.

Conclusion

Gary D. Seifert's contributions to electro-optic technology, particularly in high voltage sensing, demonstrate his commitment to innovation. His patents reflect a deep understanding of complex systems and a drive to improve measurement techniques.

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