Langebrück, Germany

Günther Czech


Average Co-Inventor Count = 3.9

ph-index = 2

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 2003-2004

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4 patents (USPTO):Explore Patents

Title: Günther Czech: Innovator in Semiconductor Lithography

Introduction

Günther Czech is a notable inventor based in Langebrück, Germany. He has made significant contributions to the field of semiconductor lithography, holding a total of 4 patents. His work focuses on methods for verifying imaging errors in photomasks and optical exposure units, which are crucial for the production of microchips.

Latest Patents

Czech's latest patents include a method for experimentally verifying imaging errors in photomasks. This method enables the determination of imaging errors for the lithographic structuring of semiconductors. A latent image of the mask is produced in a photoactivatable layer through exposure. After heat treatment to increase contrast and development of the exposed resist, the resist is treated with an amplification agent that diffuses into the exposed parts. This reaction leads to an increase in the layer thickness of the resist in those areas. A topographical image of the photoresist surface, created by scanning electron microscopy, indicates imaging errors through protuberances located outside the mask image. This method allows for testing the mask layout under production conditions, facilitating the adjustment and checking of all components of the phototransfer system used in microchip production.

Another significant patent by Czech is a method for experimentally verifying imaging errors in optical exposure units. This method determines imaging errors in optical exposure units used for lithographic structuring. Similar to his previous patent, a latent image of a mask is produced in a photoactivatable layer by exposure using the optical exposure unit being tested. After heat treatment and development, the resist is treated with an amplification agent, leading to an increase in layer thickness in the exposed parts. A topographical image of the photoresist surface indicates imaging errors, allowing for testing of optical exposure units under production conditions and facilitating the adjustment of all components of the exposure system.

Career Highlights

Günther Czech is currently employed at Infineon Technologies AG, where he continues to innovate in the semiconductor industry. His work has been instrumental in enhancing the accuracy and efficiency of microchip production.

Collaborations

Czech has collaborated with notable colleagues such as Carsten Fülber and Ernst-Christian Richter, contributing to advancements in semiconductor technology.

Conclusion

Günther Czech's contributions to semiconductor lithography through his innovative patents have significantly impacted the industry. His methods for

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