Marcoussis, France

Gaelle Le Meur

This inventor holds 1 USPTO granted patent. Top assignee: Alcatel. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gaelle Le Meur. Retrieved from https://idiyas.com/inventor/gaelle-le-meur

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Gaelle Le Meur: Innovator in Optical Signal Processing

Introduction

Gaelle Le Meur is a prominent inventor based in Marcoussis, France. She has made significant contributions to the field of optical signal processing, particularly in the development of methods that enhance data transmission capabilities.

Latest Patents

Gaelle Le Meur holds a patent for a "Method and system for generating CS-RZ pulses showing narrow width of bit duration." This innovative method focuses on processing optical signals and includes a transmitter designed for ultra-high bit rates. The technique utilizes an optical pulse stream in a carrier suppressed return to zero (CS-RZ) format, achieved through an optical modulator driven by a combination of two sinusoidal electrical voltages.

Career Highlights

Gaelle is currently employed at Alcatel, a leading telecommunications company. Her work at Alcatel has allowed her to explore advanced technologies in optical communications, contributing to the evolution of high-speed data transmission.

Collaborations

One of her notable collaborators is Patrick Brindel, with whom she has worked closely on various projects related to optical signal processing.

Conclusion

Gaelle Le Meur's innovative work in optical signal processing exemplifies her commitment to advancing telecommunications technology. Her contributions, particularly in generating CS-RZ pulses, highlight her role as a key figure in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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