Cavaillon, France

Gael Loic Marie Vuillermet

This inventor holds 1 USPTO granted patent. Top assignee: Saint-Gobain Centre De Recherches Et D'etudes Europeen. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gael Loic Marie Vuillermet. Retrieved from https://idiyas.com/inventor/gael-loic-marie-vuillermet

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Gael Loic Marie Vuillermet: Inventor of an Instrumented Furnace Plate.

Introduction

Gael Loic Marie Vuillermet is an inventor based in Cavaillon, France. His patent work includes an instrumented plate designed to monitor refractory components in furnaces. He is associated with Saint-Gobain Centre de Recherches et d’Études Européen.

Latest Patents

Vuillermet is credited with 1 patent: “Instrumented Plate for Oven.” The invention describes a support plate with multiple orifices, made at least partly from a ceramic-matrix composite or a precursor material that can transform into the composite when heated. A sensor carried by the support plate enables monitoring of a refractory part of a furnace.

Career Highlights

Vuillermet’s patent reflects work on instrumented materials and monitoring technologies for high-temperature furnace environments. The design combines a sensor with a support plate made from materials suited to demanding thermal conditions.

Collaborations

His listed coworkers include Olivier Citti and Sébastien Pinson. His association with Saint-Gobain Centre de Recherches et d’Études Européen places his invention within an industrial research and development setting.

Conclusion

Gael Loic Marie Vuillermet’s patent presents an instrumented ceramic-composite plate for monitoring furnace refractory parts, highlighting his contribution to materials and sensing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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