G Lorimer Miller

Title: G Lorimer Miller: Innovator in Thickness Measurement Technology

Introduction

G Lorimer Miller is a notable inventor based in Eastham, MA (US). He has made significant contributions to the field of measurement technology, particularly in the dynamic measurement of substrate thickness. His innovative approach has led to the development of a unique apparatus that enhances the accuracy and efficiency of thickness measurement.

Latest Patents

Miller holds a patent for an "Apparatus and method of dynamically measuring thickness of a layer of a substrate." This invention provides a method and apparatus for measuring the thickness of a test object using an eddy current sensor. The apparatus features first and second sensor heads positioned with a predetermined gap, allowing for the passage of the test object. As the test object moves through the gap, the sensor heads make measurements at specific sampling locations. Additionally, a position sensing mechanism determines the positions of these sampling locations, while an evaluation circuit processes the data to determine the thickness of the test object.

Career Highlights

Miller is associated with Applied Materials, Inc., a leading company in the field of materials engineering. His work at this organization has allowed him to collaborate with other talented professionals, contributing to advancements in technology and innovation.

Collaborations

Some of Miller's coworkers include Lawrence C Lei and Siqing Lu. Their collective expertise has fostered a collaborative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

G Lorimer Miller's contributions to the field of thickness measurement technology exemplify the spirit of innovation. His patent and work at Applied Materials, Inc. highlight his commitment to advancing measurement techniques.