Chengdu, China

Fuzhi Chen

This inventor holds 1 USPTO granted patent. Top assignee: Southwest Petroleum University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fuzhi Chen. Retrieved from https://idiyas.com/inventor/fuzhi-chen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Fuzhi Chen: Innovator in Optical Measurement Technology

Introduction

Fuzhi Chen is a notable inventor based in Chengdu, China. He has made significant contributions to the field of optical measurement technology. His innovative work focuses on enhancing the accuracy and efficiency of measuring viewing angles in optical components.

Latest Patents

Fuzhi Chen holds a patent for a dual-dial measurement device and a measurement method for viewing angle measurement of optical components. This device includes a support frame, a large dial, a small dial, a vernier disc, verniers, and an objective table. The invention allows for precise measurement of the effective viewing angle of optical components, providing valuable guidance for evaluating optical systems.

Career Highlights

Fuzhi Chen is affiliated with Southwest Petroleum University, where he contributes to research and development in optical technologies. His work has garnered attention for its practical applications in various industries, particularly in improving optical component performance.

Collaborations

Fuzhi Chen has collaborated with colleagues such as Yi Qiu and Wei Wang. Their joint efforts have further advanced the research and development of optical measurement techniques.

Conclusion

Fuzhi Chen's innovative contributions to optical measurement technology exemplify the importance of precision in engineering. His patent and ongoing research continue to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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