Tokyo, Japan

Fuyuki Kanbe

This inventor holds 2 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Kabushiki Kaisha Toshiba. Active years: 2016-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fuyuki Kanbe. Retrieved from https://idiyas.com/inventor/fuyuki-kanbe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.8

ph-index = 1

Forward Citations = 1(Granted Patents)


Location History:

  • Oume, JP (2016)
  • Tokyo, JP (2019)

Company Filing History:


Years Active: 2016-2019

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2 patents (USPTO):Explore Patents

Title: Fuyuki Kanbe - Innovator in Overcharge Protection Devices.

Introduction

Fuyuki Kanbe is an inventor based in Ome, Tokyo, Japan. He is known for his innovative work in the field of overcharge protection devices. Although he currently holds no granted patents, his contributions to the field are noteworthy.

Latest Patent Applications

Fuyuki Kanbe's latest patent application is for an overcharge protection device. This device includes a switching unit and a controller. The switching unit consists of a plurality of switching elements connected in series. These switching elements are connected in parallel to a fuse and a rechargeable battery. The fuse is interposed between the rechargeable battery and a charger designed to charge the battery. The controller detects the output voltage of the rechargeable battery. If the detected output voltage exceeds a certain overcharge detection voltage, the controller short-circuits the positive electrode terminal and the negative electrode terminal of the rechargeable battery by turning on the switching elements.

Conclusion

Fuyuki Kanbe's work in developing an overcharge protection device showcases his innovative spirit and dedication to enhancing battery safety. His contributions, although not yet recognized through granted patents, reflect the potential for future advancements in this important area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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