Kyoto, Japan

Futoshi Murakami

This inventor holds 1 USPTO granted patent. Top assignee: Murata Manufacturing Co., Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Futoshi Murakami. Retrieved from https://idiyas.com/inventor/futoshi-murakami

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Futoshi Murakami: Inventor in Printing Technology.

Introduction

Futoshi Murakami is an inventor associated with Kyoto, Japan, and Murata Manufacturing Co., Ltd. His patent work addresses printing methods and devices designed to maintain print quality while improving resolution without increasing printing time.

Latest Patents

Murakami is associated with 1 patent, titled “Printing Method and Printing Device.” The invention describes sending reference signals at intervals shorter than the minimum interval at which a multi-nozzle ink head can eject ink. At least two reference signals, each set longer than that minimum interval, are counted as one unit, and ink is ejected for each unit to form a print pattern. The final unit used to create the pattern can be lengthened by one or more reference signals, helping maintain printing quality without adding time when resolution is enhanced.

Career Highlights

Murakami’s documented patent contribution focuses on coordinating reference signals and ink ejection to support efficient, high-quality printing. He is associated with Murata Manufacturing Co., Ltd.

Collaborations

Seiji Goto and Tomoyuki Morii are identified as Murakami’s coworkers.

Conclusion

Futoshi Murakami’s patent work reflects an engineering approach to balancing print resolution, quality, and speed through precise control of ink ejection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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