Kobe, Japan

Fumiya Futamatsu

This inventor holds 1 USPTO granted patent and 2 published patent applications and 1 EPO patent. Top assignee: Sysmex Corporation. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fumiya Futamatsu. Retrieved from https://idiyas.com/inventor/fumiya-futamatsu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Fumiya Futamatsu - Innovator in Electrochemical Detection

Introduction

Fumiya Futamatsu is an inventor based in Kobe-shi, Japan. He is known for his work in the field of electrochemical detection. Although he currently holds no granted patents, his innovative ideas contribute to advancements in analytical methods.

Latest Patent Applications

Fumiya Futamatsu has submitted a patent application titled "METHOD AND KIT FOR ELECTROCHEMICALLY DETECTING ANALYTE." This application describes a method for electrochemically detecting an analyte contained in a sample using a working electrode and a counter electrode. The method involves allowing an electrolyte solution, which contains a solution prepared by dissolving an imidazolium iodide compound in a protic solvent, to come into contact with the working electrode and the counter electrode. The process aims to electrochemically detect the analyte in the presence of the electrolyte solution. Additionally, a kit designed for this detection method is also disclosed in the application.

Conclusion

Fumiya Futamatsu's contributions to the field of electrochemical detection highlight his innovative approach to analytical methods. His ongoing work may lead to significant advancements in the detection of various analytes in samples.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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