Yokohama, Japan

Fumiya Furuno

This inventor holds 1 USPTO granted patent. Top assignee: Tokyo Keiso Kabushiki-Kaisha. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fumiya Furuno. Retrieved from https://idiyas.com/inventor/fumiya-furuno

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Fumiya Furuno: Innovator in Flow Measurement Technology

Introduction

Fumiya Furuno is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of flow measurement technology. His innovative approach has led to the development of a unique area flow meter that enhances measurement accuracy.

Latest Patents

Furuno holds a patent for an "Area flow meter with hall devices having magnetism-responsive surfaces." This invention features a float made of a material with a specific gravity greater than the fluid being measured. The design includes a magnet aligned vertically to produce magnetic-force lines symmetrically. Additionally, a magnetism-gathering tapered element is utilized to enhance output sensitivity for detecting the float's position.

Career Highlights

Fumiya Furuno is currently employed at Tokyo Keiso Kabushiki-kaisha, where he continues to innovate in the field of flow measurement. His work has been instrumental in advancing the technology used in various applications.

Collaborations

Furuno collaborates with his coworker, Tokio Sugi, to further enhance their research and development efforts. Their teamwork has contributed to the successful implementation of innovative solutions in their projects.

Conclusion

Fumiya Furuno's contributions to flow measurement technology exemplify the impact of innovative thinking in engineering. His patent and ongoing work at Tokyo Keiso Kabushiki-kaisha highlight his commitment to advancing measurement accuracy and efficiency.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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