Tokyo, Japan

Fumio Koda

This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Topcon. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fumio Koda. Retrieved from https://idiyas.com/inventor/fumio-koda-umdejris

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Fumio Koda: Innovator in Surface Inspection Technology

Introduction

Fumio Koda is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of surface inspection technology. His innovative approach has led to the development of a unique patent that enhances the accuracy of detecting internal subjects.

Latest Patents

Fumio Koda holds a patent for a "Surface inspecting method and device." This invention involves a light source section that outputs optical flux with two types of wavelengths: a short wavelength and a long wavelength. The intensity of the optical flux is variable, allowing for precise measurements. The method compares outputs from light intensity detecting sections for both wavelengths to calculate a disappearance level. This level is crucial for measuring subjects inside the body, ensuring that the first intensity of the long wavelength is set higher than the disappearance level.

Career Highlights

Fumio Koda is associated with Kabushiki Kaisha Topcon, a company known for its advancements in optical technology. His work has been instrumental in developing methods that improve surface inspection processes. His innovative spirit and technical expertise have positioned him as a key figure in his field.

Collaborations

Fumio Koda has collaborated with notable colleagues, including Hisashi Isozaki and Takehiro Takase. Their combined efforts have contributed to the success of various projects within the company.

Conclusion

Fumio Koda's contributions to surface inspection technology exemplify the impact of innovation in the field. His patent and collaborative efforts continue to influence advancements in optical measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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