Hachioji, Japan

Fumio Asakawa

This inventor holds 1 USPTO granted patent. Top assignees: Japan Spectroscopic Co., Ltd., Kawasaki Steel Corporation, Spectral Instrument Co.. Active years: 1987.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fumio Asakawa. Retrieved from https://idiyas.com/inventor/fumio-asakawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1987

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1 patent (USPTO):Explore Patents

Title: Fumio Asakawa: Innovator in Laser Emission Spectroscopy

Introduction

Fumio Asakawa is a notable inventor based in Hachiouji, Japan. He has made significant contributions to the field of laser emission spectroscopy. His innovative approach has led to advancements in the measurement of substances in fluid states.

Latest Patents

Fumio Asakawa holds a patent for a method of performing continuous on-line laser emission spectroscopy. The patent describes a focusing lens with a focal length f, positioned at a distance L from the substance to be measured. The relationship between L and f is controlled to optimize the measurement process.

Career Highlights

Throughout his career, Asakawa has worked with prominent companies, including Kawasaki Steel Corporation and Japan Spectroscopic Co., Ltd. His work has been instrumental in enhancing the capabilities of laser spectroscopy technologies.

Collaborations

Asakawa has collaborated with notable colleagues, including Kouzou Tsunoyama and Wataru Tanimoto. Their combined expertise has contributed to the success of various projects in the field.

Conclusion

Fumio Asakawa's contributions to laser emission spectroscopy demonstrate his innovative spirit and dedication to advancing technology. His work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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