IDiyas

For the Inventor, By the Inventor

Kanagawa, Japan

Fumihiro Nakashige

USPTO Granted Patents = 12 


Average Co-Inventor Count = 2.1

ph-index = 3

Forward Citations = 26(Granted Patents)


Company Filing History:

goldMedal12 out of 28,544 
 
Ricoh Company, Ltd.
 patents

Years Active: 2006-2022

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12 patents (USPTO):Explore Patents
1. 11282187 - Inspection system, inspection apparatus, and method using multiple angle illumination (2022-03-22),
2. 10401287 - Lighting device, and apparatus and system incorporating the lighting device (2019-09-03),
3. 9524696 - Image projection device (2016-12-20),
4. 9470966 - Image projection apparatus and presentation system (2016-10-18),
5. 9401129 - Image projection device (2016-07-26),
6. 8634108 - Method and apparatus for inspecting image, image forming apparatus, and computer-readable recording medium storing image inspecting program (2014-01-21),
7. 8587844 - Image inspecting apparatus, image inspecting method, and image forming apparatus (2013-11-19),
8. 8537421 - Image processing apparatus, method, and program product removing show-through from density image using mask image generated from gloss image (2013-09-17),
9. 8169672 - Image scanning device and illuminating device that divide a light beam from a light source into multiple light beams and direct the multiple light beams to a target (2012-05-01),
10. 7342679 - Image evaluation apparatus and method (2008-03-11),
11. 7158738 - Image reader apparatus and cylinder shaped lamp used for the same (2007-01-02),
12. 7054580 - Image reader apparatus and cylinder shaped lamp used for the same (2006-05-30),

Title: Fumihiro Nakashige: Innovator in Inspection Systems

Introduction

Fumihiro Nakashige is a prominent inventor based in Kanagawa, Japan. He has made significant contributions to the field of inspection systems, holding a total of 12 patents. His work focuses on enhancing the efficiency and effectiveness of inspection processes through innovative technologies.

Latest Patents

Nakashige's latest patents include an inspection system that utilizes multiple angle illumination. This system is designed to inspect a target by employing a first lighting device that irradiates light from a specific direction and a second lighting device that provides light from an oblique angle. The system also features an image capture device that acquires images for inspection purposes. Another notable patent involves a lighting device that incorporates a honeycomb structure, enhancing the emission of light through a curved arrangement.

Career Highlights

Fumihiro Nakashige is currently associated with Ricoh Company, Ltd., where he continues to develop innovative solutions in the field of inspection technology. His expertise and dedication have positioned him as a key figure in advancing inspection methodologies.

Collaborations

Nakashige collaborates with Otoichi Nakata, contributing to the development of cutting-edge technologies in their field. Their partnership has led to significant advancements in inspection systems.

Conclusion

Fumihiro Nakashige's contributions to inspection technology through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the industry positively, paving the way for future innovations.

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