Kawasaki, Japan

Fumihiko Yoshizawa

This inventor holds 1 USPTO granted patent. Top assignee: Fujitsu Corporation. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fumihiko Yoshizawa. Retrieved from https://idiyas.com/inventor/fumihiko-yoshizawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Fumihiko Yoshizawa: Patent Inventor in Kawasaki

Introduction

Fumihiko Yoshizawa is an inventor associated with Fujitsu Corporation and based in Kawasaki, Japan. His patent work includes a camera-control system designed to help prevent inappropriate photography.

Latest Patents

The provided information lists one patent for Yoshizawa: Electronic Device, Photographing Control Method, Photographing Control Program, and Processor. The invention describes an electronic device with a camera function that can issue and detect reporting information related to photography. Using that information, the device determines whether photography is permitted, whether an image should be stored, and whether it may be altered. These controls are intended to help block inappropriate photography, such as spy shots. Yoshizawa is credited with 1 patent.

Career Highlights

Yoshizawa’s listed invention addresses privacy and photography controls in electronic devices. The patent describes coordinated reporting, information detection, and image-output judgment functions.

Collaborations

Yoshizawa’s listed coworkers include Yuuichi Abe and Muneyasu Miyamoto. His company affiliation is Fujitsu Corporation.

Conclusion

Fumihiko Yoshizawa’s recorded patent work focuses on using device-level controls to regulate photography and image handling, reflecting an effort to deter unauthorized or inappropriate image capture.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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