Location History:
- Osaka, JP (1996)
- Kkoma, JP (1998)
- Ikoma, JP (2000)
Company Filing History:
Years Active: 1996-2000
Title: Fumihiko Noro: Innovator in Semiconductor Memory Technology
Introduction
Fumihiko Noro is a notable inventor based in Ikoma, Japan. He has made significant contributions to the field of semiconductor memory devices. With a total of 3 patents to his name, Noro's work has had a lasting impact on technology.
Latest Patents
Noro's latest patents include innovative methods for forming semiconductor memory devices. One of his patents describes a floating gate type semiconductor memory and a method of manufacture that includes an erasing gate electrode. This design allows for the easy formation of a tunneling region while maintaining high reliability. The process involves forming an active region isolated by element isolation insulating films on a semiconductor substrate. A gate insulating film and a floating gate electrode are sequentially formed on this active region. A control gate electrode is positioned above the floating gate electrode, separated by a silicon oxide film. Additionally, a tunneling insulating film is formed only on the side wall of the floating gate electrode, followed by the formation of an erasing gate electrode that covers the tunneling insulating film.
Career Highlights
Throughout his career, Noro has worked with prominent companies in the electronics industry. He has been associated with Matsushita Electronics Corporation and Matsushita Electronics Company. His experience in these organizations has contributed to his expertise in semiconductor technology.
Collaborations
Noro has collaborated with several talented individuals in his field. Notable coworkers include Kyoko Miyamoto and Kazuo Sato, who have also made significant contributions to semiconductor technology.
Conclusion
Fumihiko Noro's innovative work in semiconductor memory technology has established him as a key figure in the industry. His patents reflect a commitment to advancing technology and improving the reliability of semiconductor devices. His contributions continue to influence the field and inspire future innovations.