Taipei, Taiwan

Fu-Yao Cheng

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Stanley Black & Decker Mea Fze. Active years: 2026.


% Patents Active = 100.0

 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Fu-Yao Cheng: Innovator in Container Latch Technology

Introduction

Fu-Yao Cheng is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of container technology, particularly with his innovative designs that enhance functionality and usability.

Latest Patents

Cheng holds a patent for a "Low Profile Latch." This invention relates to a latch designed for selectively binding the lower and upper portions of a container. The latch features a base with a front face, a rear face, a connected end, and a selectively engageable binding end. The rear face includes an upward hook, a downward hook, and a binding tooth. The design allows for both axial and pivotal movement of the latch, enabling it to transition between an upward position and a low profile position. This innovative mechanism enhances the efficiency of container usage.

Career Highlights

Fu-Yao Cheng is currently employed at Stanley Black & Decker Mea Fze, a company known for its commitment to innovation and quality in tools and hardware. His work there has allowed him to further develop his ideas and contribute to the company's product offerings.

Collaborations

Cheng collaborates with talented coworkers, including Jin-Chi Huang and Xiang-Kai Hsu. Their combined expertise fosters a creative environment that drives innovation in their projects.

Conclusion

Fu-Yao Cheng's contributions to latch technology exemplify the spirit of innovation. His patent for the Low Profile Latch showcases his ability to solve practical problems in container design. Through his work at Stanley Black & Decker and collaborations with skilled colleagues, Cheng continues to make a significant impact in his field.

Profile summary based on public USPTO records.
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