Langenselbold, Germany

Fritz Schreyer

This inventor holds 1 USPTO granted patent. Top assignee: Nukem Limited. Active years: 1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fritz Schreyer. Retrieved from https://idiyas.com/inventor/fritz-schreyer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1985

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1 patent (USPTO):Explore Patents

Title: Fritz Schreyer and Ultrasonic Testing

Introduction

Fritz Schreyer is an inventor associated with Langenselbold, Germany. His recorded patent concerns distinguishing interfering signals from signals that may indicate defects during ultrasonic testing.

Latest Patents

Schreyer is credited with 1 patent, titled “Method for Distinguishing Between Interfering Signals and Signals.” The method addresses ultrasonic workpiece testing using the pulse-echo method. It aims to distinguish interference caused by material in the coupling medium, such as air bubbles, from signals generated by workpiece defects. When a signal crosses an adjustable threshold between the transmitting pulse and the surface echo during a test cycle, the method suppresses signals from that same cycle that fall within the anticipated range for workpiece defects.

Career Highlights

The available information associates Schreyer with Nukem Limited. His patent reflects work on improving the reliability of ultrasonic inspection by reducing the risk that interference will be mistaken for a workpiece defect.

Collaborations

Ursula Ruth and Walter Sternberg are identified as Schreyer’s coworkers. The available details do not specify their roles in the patent or the nature of their collaboration.

Conclusion

Fritz Schreyer’s recorded invention focuses on separating interference from potential defect signals in ultrasonic testing, supporting more dependable inspection of workpieces.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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