Company Filing History:
Years Active: 2010-2011
Title: Friedhelm Panteleit: Innovator in Electron Microscopy
Introduction
Friedhelm Panteleit is a notable inventor based in Aalen, Germany. He has made significant contributions to the field of electron microscopy, particularly in the inspection and processing of objects with miniaturized structures. With a total of two patents to his name, Panteleit continues to push the boundaries of technology in his field.
Latest Patents
Panteleit’s latest patents include an innovative electron microscope designed for inspecting and processing objects with miniaturized structures. The method disclosed involves processing the object by supplying reaction gas while concurrently directing an electron beam onto a specific location. This process allows for the deposition or ablation of material. Additionally, the method includes inspecting the object by scanning its surface with an electron beam, leading to the generation of backscattered and secondary electrons. These electrons are directed to an energy selector, which reflects the secondary electrons while detecting the backscattered electrons. The result is an electron microscopic image of the scanned region, which is then analyzed to determine if further material deposition or ablation is necessary. This patent also encompasses the electron microscope and processing system tailored for executing the method.
Career Highlights
Friedhelm Panteleit is currently associated with Carl Zeiss Nts GmbH, a company renowned for its advancements in optical and electron microscopy technologies. His work at this esteemed organization has allowed him to develop cutting-edge solutions that enhance the capabilities of electron microscopy.
Collaborations
Panteleit has collaborated with notable colleagues such as Johannes Bihr and Tobias Clauss. Their combined expertise contributes to the innovative projects undertaken at Carl Zeiss Nts GmbH.
Conclusion
Friedhelm Panteleit stands out as a key figure in the realm of electron microscopy, with his patents reflecting a commitment to advancing technology in the inspection and processing of miniaturized structures. His contributions are vital to the ongoing evolution of this field.