Madison, WI, United States of America

Frederick W Hyde

This inventor holds 2 USPTO granted patents. Top assignee: Illumina Corporation. Active years: 2022-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Frederick W Hyde. Retrieved from https://idiyas.com/inventor/frederick-w-hyde-6fiyh76s

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2022-2024

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2 patents (USPTO):Explore Patents

Title: The Innovations of Frederick W. Hyde

Introduction

Frederick W. Hyde is a notable inventor based in Madison, WI (US). He has made significant contributions to the field of molecular biology, particularly in the area of RNA analysis. With a total of 2 patents, his work has had a meaningful impact on scientific research.

Latest Patents

Hyde's latest patents focus on nuclease-based RNA depletion. The present disclosure is related to methods and materials for depleting unwanted RNA species from a nucleic acid sample. In particular, it describes how to remove unwanted rRNA, tRNA, mRNA, or other RNA species that could interfere with the analysis, manipulation, and study of target RNA molecules in a sample.

Career Highlights

Frederick W. Hyde is currently associated with Illumina Corporation, a leading company in the field of genomics. His work at Illumina has allowed him to further develop his innovative ideas and contribute to advancements in RNA research.

Collaborations

Some of his notable coworkers include Scott Kuersten and Asako Tetsubayashi. Their collaborative efforts have likely enhanced the research and development processes within their projects.

Conclusion

Frederick W. Hyde's contributions to RNA analysis through his patents and work at Illumina Corporation highlight his importance in the field of molecular biology. His innovative approaches continue to influence scientific research and development.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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