West Long Branch, NJ, United States of America

Frederick Renner

This inventor holds 1 USPTO granted patent. Top assignee: Alphion Corporation. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Frederick Renner. Retrieved from https://idiyas.com/inventor/frederick-renner

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 15.0

ph-index = 1


Company Filing History:


Years Active: 2005

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Frederick Renner

Introduction

Frederick Renner is an accomplished inventor based in West Long Branch, NJ (US). He has made significant contributions to the field of optical signal processing, showcasing his expertise through his innovative patent.

Latest Patents

Renner holds a patent for an "Optical Signal Quality Selection System." This invention optimizes the quality of information transmission by splitting an incoming optical signal into two equal signals. The split signals are evaluated in optical performance monitors, which transmit an electrical output message to a signal selector regarding the quality of each signal. If one signal is deemed inferior, it is dropped, allowing the non-dropped signal to be transmitted. Additionally, an unequipped optical signal is triggered if no active optical signal is being transmitted.

Career Highlights

Frederick Renner is associated with Alphion Corporation, where he has been instrumental in advancing optical technologies. His work has contributed to the development of systems that enhance communication efficiency and reliability.

Collaborations

Renner has collaborated with notable colleagues, including Mohammad Laham and Raj Acharya, who have also contributed to advancements in optical technologies.

Conclusion

Frederick Renner's innovative work in optical signal processing exemplifies his commitment to enhancing information transmission quality. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…