Manchester, CT, United States of America

Frederick P Molden


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 45(Granted Patents)


Company Filing History:


Years Active: 1976

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Frederick P Molden

Introduction

Frederick P Molden is a notable inventor based in Manchester, CT (US). He has made significant contributions to the field of surface measurement technology. His innovative approach has led to the development of a unique patent that enhances the accuracy of gauging surfaces.

Latest Patents

Molden holds a patent for a system titled "Gauging surfaces by remotely tracking multiple images." This invention provides a method for measuring the surface contour of an object by tracking the image of a spot of radiation focused on the surface. The system utilizes multiple suitable detectors that are electrically connected in parallel and positioned remotely from the surface. This design allows for continuous data collection on the surface contour, even in the presence of irregularities that may interfere with the scattered radiation. The highly accurate system is servocontrolled and can be automated for recording, storing, or displaying data. Molden's patent represents a significant advancement in surface measurement technology.

Career Highlights

Frederick P Molden is associated with United Technologies Corporation, where he has contributed to various innovative projects. His work has been instrumental in advancing technologies that require precise surface measurements.

Collaborations

Molden has collaborated with notable colleagues, including Orvey P Lowrey, Jr and James P Waters. Their combined expertise has fostered an environment of innovation and creativity within their projects.

Conclusion

Frederick P Molden's contributions to surface measurement technology through his patent and work at United Technologies Corporation highlight his role as a significant inventor in the field. His innovative systems continue to influence advancements in measurement accuracy.

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