The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 1976

Filed:

May. 08, 1975
Applicant:
Inventors:

Orvey P Lowrey, Jr, Madison, CT (US);

Frederick P Molden, Manchester, CT (US);

James P Waters, Rockville, CT (US);

Assignee:

United Technologies Corporation, Hartford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356-3 ; 356-4 ; 356167 ;
Abstract

A system for measuring the surface contour of an object by tracking the image of a spot of radiation focused on the surface is disclosed. The radiation spot is imaged on a plurality of suitable detectors which are remote to the surface and connected electrically in parallel. Continuous data on the contour of the surface is provided even though irregularities on the surface interfere with the scattered radiation propagating along the line of sight to one of the detectors. This highly accurate system is servocontrolled and can be automated for recording, storing or displaying data.


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