Frederick L Taber, Jr

Title: The Innovations of Frederick L Taber, Jr.

Introduction

Frederick L Taber, Jr. is a notable inventor based in Lagrangeville, NY (US). He has made significant contributions to the field of semiconductor testing, holding a total of 2 patents. His work focuses on improving the integrity and efficiency of testing silicon semiconductor device wafers and chips.

Latest Patents

Taber's latest patents include a "Wafer probe interface arrangement with nonresilient probe elements and support structure." This invention features a nonresilient rigid test probe arrangement designed to test the integrity of silicon semiconductor device wafers or chips. It addresses the pliant conditions encountered by current test fixtures, which can adversely affect test results. The test system interface assembly includes a rigid ceramic substrate that forms a pedestal for the rigid probe to make electrical contact. Additionally, a PC board is located on the opposite side of the ceramic substrate, with a clamp ring retaining the PC board to a test head system. Pogo pin connectors extend between the PC board and the test head system, while a stiffening element with a control aperture is bolted through the PC board to the clamp ring, creating a rigid test probe arrangement.

Another significant patent is the "Large area multiple-chip probe assembly and method of making the same." This multiple-chip probe assembly is suitable for wafer testing over a wide temperature range and includes a plurality of individual buckling beam probe elements. The support structure maintains the positioning of the probe elements during testing, ensuring effective electrical contact with multiple chips of a wafer under test.

Career Highlights

Frederick L Taber, Jr. is associated with the International Business Machines Corporation (IBM), where he has contributed to advancements in semiconductor testing technologies. His innovative designs have played a crucial role in enhancing the reliability and accuracy of testing processes in the semiconductor industry.

Collaborations

Throughout his career, Taber has collaborated with notable colleagues, including Paul M Gaschke and Gobina Das. These collaborations have further enriched his work and contributed to the development of cutting-edge technologies in the field.

Conclusion

Frederick L Taber, Jr. is a distinguished inventor whose contributions to semiconductor testing have made a significant impact on the industry. His innovative patents reflect his commitment to improving testing methodologies and ensuring the integrity of semiconductor devices.