Frederick H Schamber

Title: The Innovations of Frederick H. Schamber

Introduction

Frederick H. Schamber is a notable inventor based in Murrysville, PA (US), recognized for his contributions to the field of electron microscopy. With a total of eight patents to his name, Schamber has made significant advancements in the design and functionality of electron microscopes.

Latest Patents

Among his latest patents is an innovative electron microscope featuring multiple types of integrated x-ray detectors arranged in an array. This design includes a vacuum chamber for containing a specimen to be analyzed, an optics column with an electron source and a final probe forming lens, and a specimen stage positioned under the probe forming lens. The multiple x-ray detectors are strategically placed within the vacuum chamber at different takeoff angles to enhance the counting efficiency of the sensors. Another notable patent is for an electron microscope with integrated detectors, which includes a vacuum chamber, an optics column, and an x-ray detector with a solid-state sensor. This design also features a mechanical support system for positioning the detector within the vacuum chamber, ensuring optimal performance.

Career Highlights

Frederick H. Schamber has worked with prominent companies in the field, including FEI Company and Aspex Corporation. His experience in these organizations has contributed to his expertise and innovative capabilities in electron microscopy.

Collaborations

Throughout his career, Schamber has collaborated with notable individuals such as Cornelis G. Van Beek and Nicholas Ritchie. These collaborations have likely played a role in the development of his patented technologies.

Conclusion

Frederick H. Schamber's contributions to electron microscopy through his patents and collaborations highlight his significant impact on the field. His innovative designs continue to advance the capabilities of electron microscopes, showcasing his dedication to scientific progress.