This inventor holds 2 USPTO granted patents. Top assignees: Alatech Semiconductor, Altatech Semiconductor. Active years: 2014-2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2014-2016
Title: Frederic Pernot: Innovator in Semiconductor Inspection Technology
Introduction
Frederic Pernot is a notable inventor based in Saint-Egreve, France. He has made significant contributions to the field of semiconductor inspection technology, holding 2 patents that showcase his innovative spirit and technical expertise.
Latest Patents
Pernot's latest patents include a "Dark-field semiconductor wafer inspection device." This invention relates to a device that utilizes a light source to emit an incident beam to a wafer, incorporating a concentrator with a mirror designed for optimal light scattering detection. The device is engineered to enhance the inspection process of semiconductor wafers, ensuring high precision in identifying defects.
Another significant patent is the "Device and method for inspecting moving semiconductor wafers." This invention features a comprehensive system for detecting surface defects by analyzing variations in the slope and light intensity reflected from the wafer's surface. The device is equipped with multiple detecting members and a light source, facilitating efficient inspection and classification of semiconductor wafers.
Career Highlights
Frederic Pernot has worked with prominent companies in the semiconductor industry, including Alatech Semiconductor and Altatech Semiconductor. His experience in these organizations has contributed to his development as an inventor and has allowed him to refine his skills in semiconductor technology.
Collaborations
Throughout his career, Pernot has collaborated with talented professionals such as Philippe Gastaldo and Olivier Piffard. These collaborations have fostered an environment of innovation and have led to advancements in semiconductor inspection techniques.
Conclusion
Frederic Pernot's contributions to semiconductor inspection technology through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence the industry and improve the quality of semiconductor manufacturing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile