Saint-Egreve, France

Frederic Pernot


Average Co-Inventor Count = 2.4

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014-2016

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2 patents (USPTO):Explore Patents

Title: Frederic Pernot: Innovator in Semiconductor Inspection Technology

Introduction

Frederic Pernot is a notable inventor based in Saint-Egreve, France. He has made significant contributions to the field of semiconductor inspection technology, holding 2 patents that showcase his innovative spirit and technical expertise.

Latest Patents

Pernot's latest patents include a "Dark-field semiconductor wafer inspection device." This invention relates to a device that utilizes a light source to emit an incident beam to a wafer, incorporating a concentrator with a mirror designed for optimal light scattering detection. The device is engineered to enhance the inspection process of semiconductor wafers, ensuring high precision in identifying defects.

Another significant patent is the "Device and method for inspecting moving semiconductor wafers." This invention features a comprehensive system for detecting surface defects by analyzing variations in the slope and light intensity reflected from the wafer's surface. The device is equipped with multiple detecting members and a light source, facilitating efficient inspection and classification of semiconductor wafers.

Career Highlights

Frederic Pernot has worked with prominent companies in the semiconductor industry, including Alatech Semiconductor and Altatech Semiconductor. His experience in these organizations has contributed to his development as an inventor and has allowed him to refine his skills in semiconductor technology.

Collaborations

Throughout his career, Pernot has collaborated with talented professionals such as Philippe Gastaldo and Olivier Piffard. These collaborations have fostered an environment of innovation and have led to advancements in semiconductor inspection techniques.

Conclusion

Frederic Pernot's contributions to semiconductor inspection technology through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence the industry and improve the quality of semiconductor manufacturing processes.

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