Edinburgh, United Kingdom

Fraser Cook

This inventor holds 1 USPTO granted patent. Top assignee: Qualitrol Company LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fraser Cook. Retrieved from https://idiyas.com/inventor/fraser-cook

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Fraser Cook and His Patent for Electrical Fault Detection.

Introduction

Fraser Cook is an inventor associated with Edinburgh, Great Britain, and Qualitrol Company LLC. His patent work addresses the detection and real-time location of electrical discharges in gas-insulated switchgear.

Latest Patents

Cook is associated with 1 patent, titled “Detection and Location of Partial Discharge and Arc Faults.” The invention describes a system and method that senses ultra-high-frequency signals from electrical discharges across multiple channels simultaneously. It compares the signals to determine whether they originate from the same discharge and uses an artificial intelligence training model to classify the discharge as a partial discharge or an arc. The system estimates the discharge’s location using signal attenuation profiles, amplitude information, and distances between adjacent channels.

Career Highlights

Cook’s patent reflects work on monitoring and diagnosing electrical equipment. By combining multi-channel sensing, artificial intelligence, and location estimation, the disclosed approach aims to help identify faults in gas-insulated switchgear in real time.

Collaborations

Cook’s listed coworkers include Thomas Linn and Colin Brown. The patent information provided does not specify their roles or contributions to the invention.

Conclusion

Fraser Cook’s patent focuses on using coordinated signal analysis and artificial intelligence to detect, classify, and locate electrical discharges in gas-insulated switchgear.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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