CA

François Houde

This inventor holds 1 USPTO granted patent. Top assignee: Olympus America Inc.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: François Houde. Retrieved from https://idiyas.com/inventor/françois-houde-6ahnudf0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: François Houde: Innovator in Non-Destructive Testing

Introduction

François Houde is a notable inventor based in Canada, recognized for his contributions to the field of non-destructive testing. He has developed innovative solutions that enhance the efficiency and effectiveness of testing instruments used in various industries.

Latest Patents

Houde holds a patent for a "Casing for a Portable Non-Destructive Test Instrument." This invention is designed to improve the portability and durability of testing equipment, making it easier for professionals to conduct tests in diverse environments. He has 1 patent to his name.

Career Highlights

François Houde is currently employed at Olympus America Inc., a company known for its advanced imaging and testing technologies. His work at Olympus has allowed him to apply his inventive skills to real-world applications, contributing to the company's reputation for innovation.

Collaborations

Throughout his career, Houde has collaborated with talented individuals such as Sébastien Larose and Benjamin Spay. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

François Houde's contributions to non-destructive testing exemplify the impact of innovation in technology. His work continues to influence the industry, showcasing the importance of inventive thinking in solving practical challenges.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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