Braunschweig, Germany

Franz Waeldele

This inventor holds 1 USPTO granted patent. Top assignee: Leitz Messtechnik Gmbh. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Franz Waeldele. Retrieved from https://idiyas.com/inventor/franz-waeldele

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Franz Waeldele: Innovator in Coordinate Measuring Technology

Introduction

Franz Waeldele is a notable inventor based in Braunschweig, Germany. He has made significant contributions to the field of coordinate measuring technology. His innovative approach has led to the development of a unique patent that enhances measurement accuracy.

Latest Patents

Franz Waeldele holds a patent for "Test specimens composed of rod segments for coordinate measuring." This invention is designed to improve the precision and reliability of measurements in various applications. The patent showcases his expertise and commitment to advancing measurement technology.

Career Highlights

Franz Waeldele is currently employed at Leitz Messtechnik GmbH, a company renowned for its high-quality measurement solutions. His role at the company allows him to apply his innovative ideas and contribute to the development of cutting-edge measurement instruments. His work has been instrumental in enhancing the company's product offerings.

Collaborations

Franz collaborates with his coworker, Eugen Trapet, to further advance their projects and innovations. Their teamwork exemplifies the importance of collaboration in the field of technology and innovation.

Conclusion

Franz Waeldele's contributions to coordinate measuring technology through his patent and work at Leitz Messtechnik GmbH highlight his role as a key innovator in the industry. His dedication to improving measurement accuracy continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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