Burgkirchen, Germany

Franz Maier

This inventor holds 1 USPTO granted patent. Top assignee: Hoechst Aktiengesellschaft. Active years: 1976.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Franz Maier. Retrieved from https://idiyas.com/inventor/franz-maier-43xm98l2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1976

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1 patent (USPTO):Explore Patents

Title: Franz Maier: Innovator in Infrared Measurement Technology

Introduction

Franz Maier is a notable inventor based in Burgkirchen, Germany. He has made significant contributions to the field of infrared measurement technology, particularly in the context of thermoplastic materials. His innovative approach has led to the development of a unique patent that enhances the efficiency of measuring kneading masses in industrial applications.

Latest Patents

Franz Maier holds a patent for an "Infrared process for measuring the kneading mass in a calender roller gap." This invention focuses on measuring the thickness of a thermoplastic kneading mass at temperatures of at least 40°C. The process involves scanning the feeding region of a roller gap using an infrared radiation receiver with high geometrical resolution. The technology records the curve of thermal radiation to determine the thickness of the kneading mass, providing valuable data for manufacturing processes.

Career Highlights

Throughout his career, Franz Maier has been associated with Hoechst Aktiengesellschaft, a prominent company in the chemical and pharmaceutical industry. His work has been instrumental in advancing measurement techniques that are crucial for quality control in production environments. With a single patent to his name, he has demonstrated a commitment to innovation and practical applications of technology.

Collaborations

Franz Maier has collaborated with notable colleagues, including Walter Niederstatter and Hans-Rainer Stumpf. These partnerships have fostered an environment of creativity and innovation, contributing to the development of advanced measurement technologies.

Conclusion

Franz Maier's contributions to infrared measurement technology exemplify the impact of innovative thinking in industrial applications. His patent reflects a significant advancement in the field, showcasing the importance of precise measurement techniques in manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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