St. Nikolai/Sausal, Austria

Franz Helmli

This inventor holds 1 USPTO granted patent. Top assignee: Alicona Imaging Gmbh. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Franz Helmli. Retrieved from https://idiyas.com/inventor/franz-helmli

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Biography of Inventor Franz Helmli

Introduction: Franz Helmli is a notable inventor based in St. Nikolai/Sausal, Austria. He is recognized for his innovative contributions to optical technology, particularly in the field of microscopy.

Latest Patents: Helmli holds a patent for an illumination device designed for microscopes and optical 3D surface measuring apparatuses. This device operates on the principle of focus variation and incorporates LEDs arranged in a planar configuration. The illumination optical unit is engineered to project the illumination spectrum onto the object being examined, utilizing a combination of converging lenses and a Fresnel lens.

Career Highlights: Helmli is associated with Alicona Imaging GmbH, where he applies his expertise in optical technologies. His work has significantly advanced the capabilities of optical measurement devices, enhancing their precision and functionality.

Collaborations: Throughout his career, Helmli has collaborated with esteemed colleagues such as Manfred Prantl and Stefan Scherer. These partnerships have fostered innovation and contributed to the development of cutting-edge optical solutions.

Conclusion: Franz Helmli's contributions to the field of optical technology exemplify the spirit of innovation. His patent for the illumination device showcases his commitment to advancing scientific tools that enhance research and measurement accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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