Eindhoven, Netherlands

Fransisca M De Brouwer

This inventor holds 1 USPTO granted patent. Top assignee: U.S. Philips Corporation. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fransisca M De Brouwer. Retrieved from https://idiyas.com/inventor/fransisca-m-de-brouwer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Fransisca M. De Brouwer and an Adjustable Computer Tomography Device.

Introduction

Fransisca M. De Brouwer is an inventor associated with Eindhoven, the Netherlands. Her listed patent work concerns an adjustable computer tomography device developed for radiological imaging.

Latest Patents

The available information lists one patent for De Brouwer: “Adjustable Computer Tomography Device.” The invention uses an X-ray source and an X-ray detection system to produce density profiles of an object, while a reconstruction unit derives an image signal from those profiles. Its control system adjusts the X-ray source according to the object’s density and the part being examined, using a reference adjustment that also depends on that part. The listed patent count is 1 patent.

Career Highlights

De Brouwer is associated with U.S. Philips Corporation. Her listed invention focuses on adapting X-ray source settings to the region under examination, a feature intended to support computer tomography imaging.

Collaborations

The provided information names Jan Timmer and Jantje E. Wilting as De Brouwer’s coworkers. It does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Fransisca M. De Brouwer’s listed patent reflects work on adjustable computer tomography, with controls that tailor X-ray source settings to the object and region being examined.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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