This inventor holds 1 USPTO granted patent. Top assignee: U.S. Philips Corporation. Active years: 1997.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1997
Title: The Innovative Contributions of Frans J Berkers
Introduction
Frans J Berkers is a notable inventor based in Vessem, Netherlands. He has made significant contributions to the field of X-ray technology, particularly through his innovative patent that enhances the functionality of X-ray apparatuses. His work is recognized for its potential to improve medical imaging and diagnostics.
Latest Patents
Frans J Berkers holds a patent for an X-ray apparatus comprising a filter. This invention is designed to limit the dynamic range of an X-ray image formed on an X-ray detector by exposing an object, such as a patient, to X-rays. The apparatus features a filter with elements that include capillary tubes, which communicate with a reservoir containing an X-ray absorbing liquid. The adhesion of this liquid to the inner side of the capillary tubes can be adjusted using an electric voltage applied to an electrically conductive layer. This innovative design allows for rapid adjustments to the X-ray absorption profile, enabling changes within a very short period, such as one second.
Career Highlights
Frans J Berkers is associated with U.S. Philips Corporation, where he has contributed to advancements in imaging technology. His work has been instrumental in developing solutions that enhance the quality and efficiency of X-ray imaging.
Collaborations
Frans has collaborated with notable colleagues, including Petrus W Linders and Andre R De Wit. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Frans J Berkers is a distinguished inventor whose work in X-ray technology exemplifies the impact of innovation in medical imaging. His contributions continue to influence the field and improve diagnostic capabilities.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
